TD-ScanPRO™

Vector translation tool of choice by National Instruments Customers
TD-ScanPro is a result of the collaboration between TSSI and National Instruments to enable test engineers to import standard EDA formats such as WGL, STIL, VCD, and EVCD to the latest NI STS digital pattern format (.digipat, .digitiming, .digilevel, and specs).
Features and Benefits:
  • Suports both the new PXIe 6570/1 patterns, and the older PXIe 654x/655x/656x waveforms.
  • Scalability.  
  • A single pattern conversion job can be done on a laptop, or a batch of hundreds of patterns can be submitted to a server farm. 

  • Flow-based self-documented graphical user interface is similar to LabVIEW usage, yet can be executed in a command line batch process.

  • A comprehensive utility library for data management, conditioning, and viewing to fit any functional and scan patterns to the NI STS platform.

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