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TSSI Demonstrates Robust Pattern Conversion Software for the Chroma Test Systems at SemiconWest 2015

BEAVERTON, Ore., -- July 5, 2015 -- Test Systems Strategies, Inc. (TSSI), the worldwide leader in design to test pattern conversion, simulation and validation tools announced today a new software module to convert and validate test patterns from EDA to the Chroma test systems.

Since its introduction in 2012, Solstice™ has been successfully installed in many semiconductor companies, large and small.  For the Chroma 33xx VLSI Test Systems, and the Chroma 36xx SoC/Analog Test Systems, TSSI will demonstrate the new Solstice for Chroma software module at the SemiconWest 2015 held in San Francisco, California from July 14 to 16, 2015.

Solstice for Chroma simplifies the tasks of converting functional patterns (VCD and EVCD) to the Chroma test systems format using its intuitive, easy-to-use user interface, yet with advanced cyclization technology behind the scene.  For scan patterns (WGL and STIL), Solstice for Chroma delivers a push-button operation because scan patterns already come with timing.

Solstice for Chroma runs on Windows operating system and with a list price of $3500 USD on a perpetual basis.  

"TSSI continues to serve our large installed base with flexibility and quality."  Said Hau Lam, TSSI's CEO.  "Chroma's test systems are Windows-based.  Chroma's users test their high end consumer electronic devices under very tight schedule and strict budget.  TSSI has responded with a fast, easy-to-use, and lowest cost design-to-test tool, the Solstice for Chroma."

Visit booth 5568 at Semicon West 2015 to see a demo and receive a 50% off of the already lowest priced tool in the market.

Information is also available online: tessi.com/chroma.html