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TSSI Show Cases Its Virtual Test Solutions at the 49th DAC as an ARM Partner

 Design Automation Conference, San Francisco, CA, June 03, 2012 - Test Systems Strategies Incorporated (TSSI) attends the 49th DAC this year as an ARM Partner show casing the TSSI Virtual Test (TVT) solutions.

Integrating IP cores, such as ARM cores, involves bringing core-level test patterns together for chip-level test and verification. TSSI’s TVT platform provides robust capabilities to address variouschallenges in full-chip test pattern integration and pre-silicon validation.

Detailed discussion of full chip pattern conversion and integration is available on ARM’s Partner Blog at:

http://blogs.arm.com/soc-design/725-core-pattern-conversion-for-soc-test-beware-of-the-poison-perl/

For pre-silicon validation capabilities for core-based and chip-level test patterns, visit TSSI at the 49th DAC, booth 703, right across from the ARM Connected Community Pavilion.

About TSSI
TSSI is the world leading provider of design-to-test pattern conversion and validation softwaresolutions. Design and test teams of all sizes use TSSI products to save time, cut costs, and dramatically decrease time to market. TSSI provides innovative products and premier services for converting functional and structural simulation data from EDA (electronic design automation) output formats to ATE (automatic test equipment) program files. The company’s revolutionary Virtual Test technologies offer design and test teams time and cost savings in pre- and post-silicon test program verification, debugging, and failure analysis. One of the company’s major contributions includes the invention of the Waveform Generation Language (WGL), the de-facto standard for DFT (design-for-test), ATPG (automatic test pattern generation) and tester interface. Readers can learn more about TSSI by visiting www.tessi.com.