News

TSSI Software Successfully Launched with National Instruments New Suite of PXI Modular Instruments for Semiconductor Test

Productronica, MUNICH, Germany – November 11, 2009 - Test Systems Strategies, Inc. (TSSI), the leader in design-to-test software products and the inventor of the Waveform Generation Language (WGL), today announced a successful launch of TD-Scan for National Instruments with a new suite of PXI Modular Instruments by National Instruments (NI).

TSSI TD-Scan for National Instruments Software is a result of collaboration between TSSI and NI to provide mutual customers with an efficient way to import WGL and STIL simulation vectors into PXI systems, a task which previously required custom software development.

TSSI and NI customers now have an integrated flow to bring up new devices on a low cost NI instruments for characterization and debugging high speed and mixed signal functionalities.

To view National Instruments press announcement, readers can visit www.ni.com or see a copy of it here:  [Productronica Press Release]

To view Test & Measurement World’s article by Rick Nelson on this announcement, readers can view it here: [Test & Measure World Article]

To view TD-Scan for NI product details, readers can visit www.tessi.com/products/td-scan

About TSSI
TSSI is the world's largest and leading provider of design-to-test pattern conversion and validation software solutions. Design and test teams of all sizes use TSSI products to save time, cut costs, and dramatically decrease time to market. TSSI provides innovative products and premier services for converting functional and structural simulation data from EDA (electronic design automation) output formats to ATE (automatic test equipment) program files. The company’s revolutionary pattern validation technologies offer design and test teams time and cost savings in pre- and post-silicon test program verification, debugging, and failure analysis. One of the company’s major contributions includes the invention of the Waveform Generation Language (WGL), the de-facto standard for DFT (design-for-test), ATPG (automatic test pattern generation) and tester interface. Readers can learn more about TSSI by visiting www.tessi.com.

About National Instruments
National Instruments (www.ni.com) is transforming the way engineers and scientists design, prototype and deploy systems for measurement, automation and embedded applications. NI empowers customers with off-the-shelf software such as NI LabVIEW and modular cost-effective hardware, and sells to a broad base of more than 30,000 different companies worldwide, with no one customer representing more than 3 percent of revenue and no one industry representing more than 15 percent of revenue. Headquartered in Austin, Texas, NI has more than 5,000 employees and direct operations in more than 40 countries. For the past 10 years, FORTUNE magazine has named NI one of the 100 best companies to work for in America. Readers can obtain investment information from the company’s investor relations department by calling (512) 683-5090, e-mailing nati@ni.com or visiting www.ni.com/nati.

TD-Scan, TSSI, TesterBridge, TestDeveloper, TDS, are trademarks of Test Systems Strategies, inc. LabVIEW, National Instruments, NI and ni.com are trademarks of National Instruments. Other product and company names listed are trademarks or trade names of their respective companies.