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TSSI and National Instruments Collaborate to Streamline Design-to-Test Process for PXI and PXI Express High-Speed Digital Instruments

AUSTIN, Texas - July 14, 2009 - National Instruments (Nasdaq: NATI) today announced its collaboration with Test Systems Strategies, Inc. (TSSI), inventor of the Waveform Generation Language (WGL), on a new software tool, TD-Scan for National Instruments, that is compatible with NI LabVIEW graphical system design software and makes it possible for semiconductor test engineers to import WGL and IEEE 1450 Standard Test Interface Language (STIL) simulation vectors into NI PXI digital test systems, a task which previously required custom software development.  Evaluation versions of the new TSSI TD-Scan for NI software will be available by request from National Instruments while the full version can be purchased from TSSI.

“Our collaboration with NI unites our semiconductor design-to-test solutions with NI automated test controller technology and helps us both meet the needs of semiconductor test engineers,” said Dave Karpenske, senior vice president for sales and marketing at TSSI. “We believe our expertise in test vector translation and validation software is a natural fit with NI and its innovative contributions to the semiconductor industry through modular, cost-effective platforms like PXI.”

The WGL and STIL vector formats commonly are used by engineers to run tests on semiconductor devices during the characterization, design validation and production test phases of product development. These vectors are generated by electronic design automation (EDA) tools and are used to stimulate a fabricated device to verify that its physical implementation matches the results achieved in simulation. The vectors are applied using digital test equipment with capabilities similar to the NI PXI-6552 100 MHz digital waveform generator/analyzer with features such as per-cycle tri-stating, onboard vector comparison, and clock data delay. The new TSSI TD-Scan for NI software eliminates custom programming previously required to make these vectors work on NI digital test equipment by automatically converting the WGL and STIL vectors to native file formats for the NI digital test equipment.

“Working with TSSI helps NI continue to deliver more innovative products to the semiconductor test market,” said Scott Savage, semiconductor market development manager at NI. “We are proud to be able to work with TSSI, a global leader in design-to-test solutions, and we anticipate being able to provide our customers enhanced design-to-test integration because of this new time-saving product.”

By making it possible for engineers to use the vector outputs from EDA software in validation and production tests on the NI digital test equipment, the TSSI TD-Scan for NI tool significantly increases this test process efficiency and flexibility. Engineers now can read and manipulate WGL and STIL vectors in LabVIEW graphical system design software and the NI Digital Waveform Editor, both of which provide control for all NI digital test hardware.

To view a webcast detailing how the new TSSI TD-Scan for NI integrates with NI PXI instrumentation, readers can visit www.ni.com/pxi