Founded in 1979, TSSI is the world's largest and leading provider of design-to-test software solutions. Design and test teams of all sizes use our products to save time, cut costs, and dramatically decrease time to market.

At ITC 2007, we are showing TSSI's continued innovation in our pioneering virtual test pattern validation solutions which enable:

1. Design teams to simulate their designs on a target ATE model for pre-tapeout validation;
2. Test teams to simulate their test patterns against the designer's DUT model for pre-silicon test pattern bring-up (without having to re-convert patterns back to testbench);
3. Test teams to simulate their finished test programs 'as is' on a target ATE model against the designer's DUT model for pre-silicon test program validation, debug, and re-targeting to a different ATE model;
4. Design and test teams to communicate in the same tool environment for post-silicon debug and failure analysis.

Visit us at booth 838 for a demo of the world premier IEEE STIL standard based TSSI VirtualTester (TVT™).

Also ask for a demo of our scalable pattern conversion tool suites, TD-Scan, TD-Sim, TestDeveloper, and TDS, which provide a comprehensive methodology to convert design formats (such as VCD, EVCD, WGL, Binary WGL, STIL, Generic ASCII, TI-TDL, TSTL, and 30 others) to all leading ATE program formats (such as Advantest T3xxx/T6xxx, Credence Sapphire/Quartet/Vista/SCxx, Eagle, Inovys, LTX Fusion, NexTest, Teradyne Flex/MicroFlex/UltraFlex/J750/Catalyst/J97x, Teseda, Verigy 93000/83000, Yokogawa, and others).