At TSSI, we're dedicated to delivering leading edge products that improve productivity, save time, and increase the overall performance design and test engineers across the globe. Explore our suite of tools and learn how they be easily integrated into your test environment.
The top tool of choice for more than 1500 of the world's top electronic firms, learn how TDS significantly reduces engineering time and costs by generating test programs from popular simulator and ATPG/scan tool outputs.
The number one choice for fabless customers, TestDeveloper rapidly reduces test development time and improves reliability with an easy-to-use graphical environment. Find out how to discover potential compatibility problems early in the process.
New Additions to the TestDeveloper Family: TD-Scan and TD-Sim.
TD-Scan. Low-cost, scalable pattern conversion software designed to translate scan patterns (ATPG) in WGL or STIL format to a target ATE program format. For functional patterns in VCD or EVCD format, TD-Scan can be seamlessly upgraded to TD-Sim described below. Pricing for TD-Scan starts at US$5,000 per year on a subscription basis.
TD-Sim. Low-cost, scalable pattern conversion software designed to translate both scan patterns mentioend above and functional patterns from logic simulators in the format of VCD or EVCD event files. TD-Sim's starting price is US$15,000 per year on a subscription basis.
Now design and test engineers can verify the test program with the design model in the simulation environment without leaving their workstation. Discover the power of Digital Virtual Tester and cut the test and debug time in half.
Resources
Visit our "Design to Test" Resource Center to download application notes, white papers, and more.
