| Why TSSI?
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As a leading innovator in design-to-test solutions (pattern conversion and validation of WGL, STIL, VCD, EVCD and other EDA formats to ATE), TSSI's development process includes an exhaustive regression suite and total-quality practices.
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News & Press Releases |
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View all articles |
| June 09, 2008 - TSSI Unveils New Design and Test Collaboration Tool at DAC 2008 | | TSSI FailMap Correlates ATE Fail Log with Design's VCD for a Faster Troubleshooting Process |  |
| March 18, 2008 - TSSI and North China University of Technology Collaborate to Support Customers and Electronic Design-to-Test Education |
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| Worldwide Customer Service
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| Our US-based call center, online support, and global distribution |
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